Microscopy & Microanalysis Traveling Poster Exhibit


Selected Posters from the M&M Annual Meeting are available for loan. For information on receiving these posters please contact:

Caroline Miller
Manager EM Center
Indiana University School of Medicine
Depart. Anatomy & Cell Bio.
635 Barnhill Dr. MS 5065, Indianapolis, IN 46202
Phone #317-274-8730, Fax #317-278-2040.
Email:caromill@iupui.edu


Microscopy and Microanalysis 2004 Poster Winners
Biological Science

1) #194, Statistical Profiles of PTK1 Kinetochore Microtubule Plus-Conformations Using High-Throughtput Electron Tomography, KJ VandenBeldt, X Meng, RM Barnard, PJ Hergert, BF McEwne, Wadsworth Center

2) #209, Application of a Multi-Photin High-Resolution Large-Scale Montage Imaging Technique to Characterize Transgenic Mouse Models of Human Neurodisorders, DL Price, SK Chow, H Hakozaki, V Phung, B Smarr, ME Martone, MH Ellisman, University of California, San Diego

3) #439, Chloroplast Sequestration in the Foraminifer Haynesina germanica: Application of High Pressure Freezing and Freeze Substitution, ST Goldstein, University of Georgia, JM Bernhard, Woods Hole Oceanographic Institution, EA Richardson, University of Georgia

4) #682, Analysis of Foreign Material From the Foot of Incontinence Device Patient, S Okerstrom, Medtronic

5) #697, Light and Electron Microscopy of the Egg Membranes and Oviduct of the Oviparous Peripatus Planipapillus mundus (Onychophora:Peripatopsidae), JM Norman, University of New South Wales, NN Tait, Macquarie University

Materials Science

1) #148, Phase Decomposition-Induced Nanocrystal Formation and Structural Disordering in Murataite Structure, J Lian, LM Wang, RC Ewing, University of Michigan

2) #151, The Effects of Rapid Cooling on the Structure and Morphology of Silicon Nanoparticles, CR Perrey, JM Deneen, CB Carter, University of Minnesota

3) #182, In-Plane Magnetic Field Lorentz Stage for Use in a TEM/SEM, NJ Zaluzed, J Hiller, RE Cook, B Kabius, D Miller, Argonne National Laboratory, VV Metlushko, University of Illinois at Chicago, TC Swihart, DW Smith, JM Matesa, JJ Gronsky, FE Fischione, EA Fischione Instruments

4) #402, Electrically Active Dislocations at the Si/GaAs Interface, S Lopatin, Lawrence Berkeley National Laboratory, G Duscher, NC State University

5) #672, Direct 3D (S) TEM Observation at Specific-site and High Resolution Using a FIB Micro-sampling Technique, T Yaguchi, M Konno, T Kamino, Hitachi Science Systems, T Hashimoto, T Ohnishi, K Umemura, Hitachi High-Technologies

MSA Micrograph Competition Ð 1st Place;

African Violet Sepal, 300x, Scanning Electron Micrograph with Adobe Photoshop Enhancement, Jeanette Killuis, NEOU College of Medicine, Rootstown, OH


Nestor J. Zaluzec / Zaluzec@Microscopy.Com